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2020 IEEE 51st Semiconductor Interface Specialists Conference (SISC)
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2020 IEEE 51st Semiconductor Interface Specialists Conference (SISC)已过期

        会议内容


        会议简介

        征稿信息立即投稿
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        征稿主题

        • SiO2andhigh-k dielectricson Si and their interfaces
        • Insulators on high-mobility and alternative substrates(SiGe, Ge, III-V and III-N, SiC, etc.)
        • MOS gate stacks withmetal gate electrodes
        • Stacked dielectrics fornon-volatile memory
        • Oxide and interface structure, chemistry, defects, and passivation: theory and experiment
        • Electrical characterization, performance and reliabilityof MOS-based devices
        • Surface cleaning technologyand impact on dielectrics and interfaces
        • Dielectrics onnanowires, nanotubes, and graphene
        • Oxide electronicsandmultiferroics
        • Interfaces in photovoltaics,e.g. Si passivation
        • 2D materials and devicesand their interfaces
        • Interfaces in semiconductorlighting and optical communications
        • Interfaces and surfaces inbiotechnology such as bio-sensing

        主办方:M. Passlack

        主办方没有公开参会单位

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