2020 IEEE 51st Semiconductor Interface Specialists Conference (SISC)
- 会议内容
2020 IEEE 51st Semiconductor Interface Specialists Conference (SISC)已过期 |
会议内容
会议简介
征稿信息立即投稿
重要日期
征稿主题
- SiO2andhigh-k dielectricson Si and their interfaces
- Insulators on high-mobility and alternative substrates(SiGe, Ge, III-V and III-N, SiC, etc.)
- MOS gate stacks withmetal gate electrodes
- Stacked dielectrics fornon-volatile memory
- Oxide and interface structure, chemistry, defects, and passivation: theory and experiment
- Electrical characterization, performance and reliabilityof MOS-based devices
- Surface cleaning technologyand impact on dielectrics and interfaces
- Dielectrics onnanowires, nanotubes, and graphene
- Oxide electronicsandmultiferroics
- Interfaces in photovoltaics,e.g. Si passivation
- 2D materials and devicesand their interfaces
- Interfaces in semiconductorlighting and optical communications
- Interfaces and surfaces inbiotechnology such as bio-sensing
主办方:M. Passlack
主办方没有公开参会单位