• Single-Event Charge Collection Phenomena and Mechanisms
• Radiation Transport, Energy Deposition and Dosimetry
• Ionizing Radiation Effects
• Materials and Device Effects
• Displacement Damage
• Processing-Induced Radiation Effects

• Single Event Effects
• MOS, Bipolar and Advanced Technologies
• Systems on Chip, GPUs, FPGAs, Microprocessors
• Isolation Technologies, such as SOI and SOS
• Methods for Hardened Design and Manufacturing
• Modeling of Devices, Circuits and Systems
• Cryogenic or High Temperature Effects
• Novel Device Structures, such as MEMs and Nanotechnologies
• Techniques for Hardening Circuits and Systems

• Characterization and Modeling of Radiation Environments
• Space Weather Events and Effects
• Spacecraft Charging
• Predicting and Verifying Soft Error Rates (SER)

• New Testing Techniques, Guidelines and Hardness Assurance Methodology
• Unique Radiation Exposure Facilities or Novel Instrumentation Methods
• Dosimetry